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Tentative list of invited speakers & titles/topics Drucken
 
Thomas Cornelius ESRF Grenoble, F In-situ studies of mechanical properties of individual nanostructures
Karl-Heinz Ernst EMPA, CH Tickling single molecules with electrons: Manipulation with the STM
Kristen Fichthorn Penn State, USA Accelerated Molecular Dynamics of thermal Desorption
Peter Flynn UIUC, USA Fast time-resolved LEEM following an ion beam probe pulse
Joost Frenken Leiden University, NL Video rate SPM techniques
Yukio Hasegawa Tokyo, J The screened potential and the Friedel oscillation observed by STM/S
Hiroki Hibino NTT, J LEEM of graphene growth on silicon carbide
Max Lagally UW Madison, USA Strain engineering in semiconductor nanomembranes: Measurements of band structure changes with x-ray absorption spectroscopy
Andrea Locatelli ELETTRA Trieste, I LEEM and XPEEM Studies of Stress-Driven Stripe Patterns in Metal Adlayers
Frank Meyer zu Heringdorf Essen, D In-Situ Analysis of Diffusion Fields of Ag on Si: Diffusion Made Visible
Gerhard Meyer
IBM Zürich, CH Simultaneous Scanning Tunneling/Atomic Force Microscopy of Individual Atoms/Molecules on Insulating Films
Karina Morgenstern Uni Hannover, D Dynamics of metallic nanoclusters
Peter Puschnig University of Leoben, A Structural and electronic properties of organic molecular films from density functional theory
Jörg Raabe SLS, Paul Scherrer Institute, CH X-ray Microscopy at the Swiss Light Source
Guus Rijnders MESA+, U Twente, Enschede, NL In situ AFM set-up
Stephan Roth DESY, Hamburg, D Observing in-situ the formation of 2D and 1D polymer-metal nanocomposites during solution casting and sputter deposition
Erdmann Spiecker Uni Erlangen, D Self-assembled nanofold pattern formation on layered crystal surfaces: A combined TEM and LEEM study.
Lidong Sun
University Linz, A In-situ characterization of organic thin films using reflectance difference spectroscopy
Peter Sutter CFN, Brookhaven Nat. Lab., USA In situ structural imaging with LEEM
Graphene on transition metals - Growth and interface physics
Ruud Tromp IBM Yorktown Heights, USA LEEM studies of graphene growth